Mutation-based Generation of Software Product Line Test Configurations

Christopher Henard, Mike Papadakis, and Yves Le Traon

Interdisciplinary Centre for Security Reliability and Trust (SnT), University of Luxembourg, Luxembourg
Contact: {firstname.lastname}

Resources regarding the paper:

[1] The PicoSAT solver
[2] The Boost library

About the source code and the implementation (C++)

About the empirical study data